Home
Mission
Personnel
Committee Members
Facility
Equipment
Regulations
Reservation
State of the Lab
Photo Album
Links
Contacts
First KAS CRSL Research Conference
Second KAS CRSL Research Conference
AUB Home
>
Faculty of Arts and Sciences
>
Central Research Science Laboratory (CRSL)
>
SEM
Scanning Electron Microscope
From TESCAN, VEGA 3 LMU with OXFORD EDX detector (INCA XMAW20)
AUB
claims no
responsibility
for the material published on its site. All photographs and images are
copyright
© American University of Beirut unless otherwise noted.
If you have any comments or suggestions about AUB,
please contact us
.
Technical contact:
webmaster@aub.edu.lb
Last modified: Thursday, 20-Jan-2011 16:45:31 EET